Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films

10.1016/S0039-9140(97)00294-4

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Bibliographic Details
Main Authors:	Bao, G.W., Li, S.F.Y.
Other Authors:	CHEMISTRY
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Atomic force microscopy Tip shapes ZnO thin films
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/95443
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Institution:	National University of Singapore

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