A novel scanning electron microscope method for the investigation of charge trapping in insulators
10.1063/1.355873
Saved in:
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95663 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-95663 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-956632024-11-10T12:34:53Z A novel scanning electron microscope method for the investigation of charge trapping in insulators Gong, H. Ong, C.K. PHYSICS 10.1063/1.355873 Journal of Applied Physics 75 1 449-453 2014-10-16T09:14:21Z 2014-10-16T09:14:21Z 1994 Article Gong, H., Ong, C.K. (1994). A novel scanning electron microscope method for the investigation of charge trapping in insulators. Journal of Applied Physics 75 (1) : 449-453. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355873 00218979 http://scholarbank.nus.edu.sg/handle/10635/95663 A1994MQ40200065 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.355873 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Gong, H. Ong, C.K. |
| format |
Article |
| author |
Gong, H. Ong, C.K. |
| spellingShingle |
Gong, H. Ong, C.K. A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| author_sort |
Gong, H. |
| title |
A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| title_short |
A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| title_full |
A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| title_fullStr |
A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| title_full_unstemmed |
A novel scanning electron microscope method for the investigation of charge trapping in insulators |
| title_sort |
novel scanning electron microscope method for the investigation of charge trapping in insulators |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/95663 |
| _version_ |
1821202533129912320 |