A novel scanning electron microscope method for the investigation of charge trapping in insulators

10.1063/1.355873

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Bibliographic Details
Main Authors: Gong, H., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95663
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Institution: National University of Singapore

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