A resonant cavity for high-accuracy measurement of microwave dielectric properties

A resonant cavity for high-accuracy measurement of microwave dielectric properties

10.1088/0957-0233/7/9/010

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Bibliographic Details
Main Authors: Chen, L., Ong, C.K., Tan, B.T.G.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95678
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Institution: National University of Singapore
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Summary:10.1088/0957-0233/7/9/010

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