A resonant cavity for high-accuracy measurement of microwave dielectric properties
10.1088/0957-0233/7/9/010
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Main Authors: | Chen, L., Ong, C.K., Tan, B.T.G. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95678 |
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Institution: | National University of Singapore |
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