Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

10.1002/mop.23141

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Bibliographic Details
Main Authors: Wang, P., Tan, C.Y., Ma, Y.G., Cheng, W.N., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
BST
Dielectric measurements
Ferroelectric
Interdigital capacitor
Varactor
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95769
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/95769

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