Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

10.1002/mop.23141

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Bibliographic Details
Main Authors: Wang, P., Tan, C.Y., Ma, Y.G., Cheng, W.N., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
BST
Dielectric measurements
Ferroelectric
Interdigital capacitor
Varactor
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95769
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-957692023-10-29T21:01:16Z Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film Wang, P. Tan, C.Y. Ma, Y.G. Cheng, W.N. Ong, C.K. PHYSICS BST Dielectric measurements Ferroelectric Interdigital capacitor Varactor 10.1002/mop.23141 Microwave and Optical Technology Letters 50 3 566-568 MOTLE 2014-10-16T09:15:36Z 2014-10-16T09:15:36Z 2008-03 Article Wang, P., Tan, C.Y., Ma, Y.G., Cheng, W.N., Ong, C.K. (2008-03). Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film. Microwave and Optical Technology Letters 50 (3) : 566-568. ScholarBank@NUS Repository. https://doi.org/10.1002/mop.23141 08952477 http://scholarbank.nus.edu.sg/handle/10635/95769 000253106400005 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic BST
Dielectric measurements
Ferroelectric
Interdigital capacitor
Varactor
spellingShingle BST
Dielectric measurements
Ferroelectric
Interdigital capacitor
Varactor
Wang, P.
Tan, C.Y.
Ma, Y.G.
Cheng, W.N.
Ong, C.K.
Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
description 10.1002/mop.23141
author2 PHYSICS
author_facet PHYSICS
Wang, P.
Tan, C.Y.
Ma, Y.G.
Cheng, W.N.
Ong, C.K.
format Article
author Wang, P.
Tan, C.Y.
Ma, Y.G.
Cheng, W.N.
Ong, C.K.
author_sort Wang, P.
title Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
title_short Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
title_full Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
title_fullStr Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
title_full_unstemmed Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
title_sort analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/95769
_version_ 1781786326860824576

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