Channeling contrast microscopy of GaN and InGaN thin films
10.1016/S0168-583X(99)00336-5
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sg-nus-scholar.10635-959452023-10-29T20:33:59Z Channeling contrast microscopy of GaN and InGaN thin films Osipowicz, T. Chiam, S.Y. Watt, F. Li, G. Chua, S.J. PHYSICS 10.1016/S0168-583X(99)00336-5 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 158 1 653-657 NIMBE 2014-10-16T09:17:40Z 2014-10-16T09:17:40Z 1999-09-02 Article Osipowicz, T., Chiam, S.Y., Watt, F., Li, G., Chua, S.J. (1999-09-02). Channeling contrast microscopy of GaN and InGaN thin films. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 158 (1) : 653-657. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(99)00336-5 0168583X http://scholarbank.nus.edu.sg/handle/10635/95945 000083666700107 Scopus |
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10.1016/S0168-583X(99)00336-5 |
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PHYSICS Osipowicz, T. Chiam, S.Y. Watt, F. Li, G. Chua, S.J. |
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Osipowicz, T. Chiam, S.Y. Watt, F. Li, G. Chua, S.J. |
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Osipowicz, T. Chiam, S.Y. Watt, F. Li, G. Chua, S.J. Channeling contrast microscopy of GaN and InGaN thin films |
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Osipowicz, T. |
title |
Channeling contrast microscopy of GaN and InGaN thin films |
title_short |
Channeling contrast microscopy of GaN and InGaN thin films |
title_full |
Channeling contrast microscopy of GaN and InGaN thin films |
title_fullStr |
Channeling contrast microscopy of GaN and InGaN thin films |
title_full_unstemmed |
Channeling contrast microscopy of GaN and InGaN thin films |
title_sort |
channeling contrast microscopy of gan and ingan thin films |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/95945 |
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