COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
10.1109/19.2670
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sg-nus-scholar.10635-960552023-10-30T07:13:58Z COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. Woon, H.S. Tan, H.S. Ng, S.C. PHYSICS 10.1109/19.2670 IEEE Transactions on Instrumentation and Measurement 37 1 86-89 IEIMA 2014-10-16T09:18:57Z 2014-10-16T09:18:57Z 1988-03 Article Woon, H.S., Tan, H.S., Ng, S.C. (1988-03). COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.. IEEE Transactions on Instrumentation and Measurement 37 (1) : 86-89. ScholarBank@NUS Repository. https://doi.org/10.1109/19.2670 00189456 http://scholarbank.nus.edu.sg/handle/10635/96055 A1988N058900018 Scopus |
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PHYSICS |
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PHYSICS Woon, H.S. Tan, H.S. Ng, S.C. |
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Article |
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Woon, H.S. Tan, H.S. Ng, S.C. |
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Woon, H.S. Tan, H.S. Ng, S.C. COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
author_sort |
Woon, H.S. |
title |
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
title_short |
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
title_full |
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
title_fullStr |
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
title_full_unstemmed |
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. |
title_sort |
computer controlled system for transient capacitance measurements of deep levels in semiconductor. |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/96055 |
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1781786377473490944 |