COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.

10.1109/19.2670

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Main Authors: Woon, H.S., Tan, H.S., Ng, S.C.
其他作者: PHYSICS
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/96055
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機構: National University of Singapore
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spelling sg-nus-scholar.10635-960552024-11-09T19:27:48Z COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR. Woon, H.S. Tan, H.S. Ng, S.C. PHYSICS 10.1109/19.2670 IEEE Transactions on Instrumentation and Measurement 37 1 86-89 IEIMA 2014-10-16T09:18:57Z 2014-10-16T09:18:57Z 1988-03 Article Woon, H.S., Tan, H.S., Ng, S.C. (1988-03). COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.. IEEE Transactions on Instrumentation and Measurement 37 (1) : 86-89. ScholarBank@NUS Repository. https://doi.org/10.1109/19.2670 00189456 http://scholarbank.nus.edu.sg/handle/10635/96055 A1988N058900018 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/19.2670
author2 PHYSICS
author_facet PHYSICS
Woon, H.S.
Tan, H.S.
Ng, S.C.
format Article
author Woon, H.S.
Tan, H.S.
Ng, S.C.
spellingShingle Woon, H.S.
Tan, H.S.
Ng, S.C.
COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
author_sort Woon, H.S.
title COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
title_short COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
title_full COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
title_fullStr COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
title_full_unstemmed COMPUTER CONTROLLED SYSTEM FOR TRANSIENT CAPACITANCE MEASUREMENTS OF DEEP LEVELS IN SEMICONDUCTOR.
title_sort computer controlled system for transient capacitance measurements of deep levels in semiconductor.
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/96055
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