Defect enhanced funneling of diffusion current in silicon

Defect enhanced funneling of diffusion current in silicon

10.1063/1.4789849

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Bibliographic Details
Main Authors: Azimi, S., Dang, Z.Y., Song, J., Breese, M.B.H., Vittone, E., Forneris, J.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96155
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/96155

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