Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique

Applied Physics B: Lasers and Optics

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Main Authors: Zhang, X., Fang, H., Tang, S., Ji, W.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96204
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-962042015-03-11T12:56:33Z Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique Zhang, X. Fang, H. Tang, S. Ji, W. PHYSICS Applied Physics B: Lasers and Optics 65 4-5 549-554 APBOE 2014-10-16T09:20:45Z 2014-10-16T09:20:45Z 1997 Article Zhang, X.,Fang, H.,Tang, S.,Ji, W. (1997). Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique. Applied Physics B: Lasers and Optics 65 (4-5) : 549-554. ScholarBank@NUS Repository. 09462171 http://scholarbank.nus.edu.sg/handle/10635/96204 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Applied Physics B: Lasers and Optics
author2 PHYSICS
author_facet PHYSICS
Zhang, X.
Fang, H.
Tang, S.
Ji, W.
format Article
author Zhang, X.
Fang, H.
Tang, S.
Ji, W.
spellingShingle Zhang, X.
Fang, H.
Tang, S.
Ji, W.
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
author_sort Zhang, X.
title Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
title_short Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
title_full Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
title_fullStr Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
title_full_unstemmed Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
title_sort determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam z-scan technique
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/96204
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