Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
Applied Physics B: Lasers and Optics
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2014
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sg-nus-scholar.10635-962042024-11-08T21:05:55Z Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique Zhang, X. Fang, H. Tang, S. Ji, W. PHYSICS Applied Physics B: Lasers and Optics 65 4-5 549-554 APBOE 2014-10-16T09:20:45Z 2014-10-16T09:20:45Z 1997 Article Zhang, X.,Fang, H.,Tang, S.,Ji, W. (1997). Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique. Applied Physics B: Lasers and Optics 65 (4-5) : 549-554. ScholarBank@NUS Repository. 09462171 http://scholarbank.nus.edu.sg/handle/10635/96204 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Applied Physics B: Lasers and Optics |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Zhang, X. Fang, H. Tang, S. Ji, W. |
| format |
Article |
| author |
Zhang, X. Fang, H. Tang, S. Ji, W. |
| spellingShingle |
Zhang, X. Fang, H. Tang, S. Ji, W. Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| author_sort |
Zhang, X. |
| title |
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| title_short |
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| title_full |
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| title_fullStr |
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| title_full_unstemmed |
Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique |
| title_sort |
determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam z-scan technique |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/96204 |
| _version_ |
1821220741933170688 |