Determination of carrier lifetime in power semiconductor devices

In this project, a comparative study on the three ramp reverse recovery methods and Open Circuit Voltage Decay (ECVD) will be carried out to the P+NN+ power diode with a uniform lifetime profile and a non-uniform lifetime profile using simulations done by the Medici Numerical Simulator. The importan...

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書目詳細資料
主要作者: Goh, Chee Hiong.
其他作者: Tan, Cher Ming
格式: Theses and Dissertations
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/4294
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機構: Nanyang Technological University