RF modelling of semiconductor devices

This report focuses on the approaches to characterize the deep submicron-meter MOSFETs operating both in DC and in high frequency region with different dimensions.

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書目詳細資料
Main Authors: Ma, Jian-Guo, Yeo, Kiat Seng, Do, Manh Anh
其他作者: School of Electrical and Electronic Engineering
格式: Research Report
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/2868
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機構: Nanyang Technological University