Determination of carrier lifetime in power semiconductor devices

• المؤلف الرئيسي: Goh, Chee Hiong.
• مؤلفون آخرون: Tan, Cher Ming
• التنسيق: Theses and Dissertations
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/4294
• المؤسسة: Nanyang Technological University

In this project, a comparative study on the three ramp reverse recovery methods and Open Circuit Voltage Decay (ECVD) will be carried out to the P+NN+ power diode with a uniform lifetime profile and a non-uniform lifetime profile using simulations done by the Medici Numerical Simulator. The importan...