Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film

Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film

10.1021/la060974q

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Bibliographic Details
Main Authors: Chua, L.-L., Dipankar, M., Sivaramakrishnan, S., Gao, X., Qi, D., Wee, A.T.S., Ho, P.K.H.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/97036
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/97036

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