Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film

10.1021/la060974q

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Main Authors: Chua, L.-L., Dipankar, M., Sivaramakrishnan, S., Gao, X., Qi, D., Wee, A.T.S., Ho, P.K.H.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/97036
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-970362024-11-12T21:16:46Z Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film Chua, L.-L. Dipankar, M. Sivaramakrishnan, S. Gao, X. Qi, D. Wee, A.T.S. Ho, P.K.H. PHYSICS 10.1021/la060974q Langmuir 22 20 8587-8594 LANGD 2014-10-16T09:30:31Z 2014-10-16T09:30:31Z 2006-09-26 Article Chua, L.-L., Dipankar, M., Sivaramakrishnan, S., Gao, X., Qi, D., Wee, A.T.S., Ho, P.K.H. (2006-09-26). Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film. Langmuir 22 (20) : 8587-8594. ScholarBank@NUS Repository. https://doi.org/10.1021/la060974q 07437463 http://scholarbank.nus.edu.sg/handle/10635/97036 000240573200049 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1021/la060974q
author2 PHYSICS
author_facet PHYSICS
Chua, L.-L.
Dipankar, M.
Sivaramakrishnan, S.
Gao, X.
Qi, D.
Wee, A.T.S.
Ho, P.K.H.
format Article
author Chua, L.-L.
Dipankar, M.
Sivaramakrishnan, S.
Gao, X.
Qi, D.
Wee, A.T.S.
Ho, P.K.H.
spellingShingle Chua, L.-L.
Dipankar, M.
Sivaramakrishnan, S.
Gao, X.
Qi, D.
Wee, A.T.S.
Ho, P.K.H.
Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
author_sort Chua, L.-L.
title Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
title_short Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
title_full Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
title_fullStr Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
title_full_unstemmed Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
title_sort large damage threshold and small electron escape depth in x-ray absorption spectroscopy of a conjugated polymer thin film
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/97036
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