Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope
10.1063/1.4871408
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sg-nus-scholar.10635-971582023-10-30T08:20:20Z Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope Wu, Z. Souza, A.D. Peng, B. Sun, W.Q. Xu, S.Y. Ong, C.K. PHYSICS 10.1063/1.4871408 AIP Advances 4 4 - 2014-10-16T09:31:58Z 2014-10-16T09:31:58Z 2014 Article Wu, Z., Souza, A.D., Peng, B., Sun, W.Q., Xu, S.Y., Ong, C.K. (2014). Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope. AIP Advances 4 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4871408 21583226 http://scholarbank.nus.edu.sg/handle/10635/97158 000336082000031 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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| description |
10.1063/1.4871408 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Wu, Z. Souza, A.D. Peng, B. Sun, W.Q. Xu, S.Y. Ong, C.K. |
| format |
Article |
| author |
Wu, Z. Souza, A.D. Peng, B. Sun, W.Q. Xu, S.Y. Ong, C.K. |
| spellingShingle |
Wu, Z. Souza, A.D. Peng, B. Sun, W.Q. Xu, S.Y. Ong, C.K. Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| author_sort |
Wu, Z. |
| title |
Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| title_short |
Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| title_full |
Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| title_fullStr |
Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| title_full_unstemmed |
Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| title_sort |
measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/97158 |
| _version_ |
1781786614305914880 |