Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

10.1063/1.4871408

Saved in:

Bibliographic Details
Main Authors:	Wu, Z., Souza, A.D., Peng, B., Sun, W.Q., Xu, S.Y., Ong, C.K.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/97158
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

Be the first to leave a comment!

Similar Items