Narrow surface transient and high depth resolution SIMS using 250 eV O2 +

10.1016/j.apsusc.2006.02.198

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Bibliographic Details
Main Authors:	Chanbasha, A.R., Wee, A.T.S.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Subjects:	Depth resolution Roughening Secondary ion mass spectroscopy Ultralow-energy
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/97299
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-97299
record_format	dspace
spelling	sg-nus-scholar.10635-972992023-10-30T22:58:30Z Narrow surface transient and high depth resolution SIMS using 250 eV O2 + Chanbasha, A.R. Wee, A.T.S. PHYSICS Depth resolution Roughening Secondary ion mass spectroscopy Ultralow-energy 10.1016/j.apsusc.2006.02.198 Applied Surface Science 252 19 7243-7246 ASUSE 2014-10-16T09:33:38Z 2014-10-16T09:33:38Z 2006-07-30 Article Chanbasha, A.R., Wee, A.T.S. (2006-07-30). Narrow surface transient and high depth resolution SIMS using 250 eV O2 +. Applied Surface Science 252 (19) : 7243-7246. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2006.02.198 01694332 http://scholarbank.nus.edu.sg/handle/10635/97299 000240609900197 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Depth resolution Roughening Secondary ion mass spectroscopy Ultralow-energy
spellingShingle	Depth resolution Roughening Secondary ion mass spectroscopy Ultralow-energy Chanbasha, A.R. Wee, A.T.S. Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
description	10.1016/j.apsusc.2006.02.198
author2	PHYSICS
author_facet	PHYSICS Chanbasha, A.R. Wee, A.T.S.
format	Article
author	Chanbasha, A.R. Wee, A.T.S.
author_sort	Chanbasha, A.R.
title	Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
title_short	Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
title_full	Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
title_fullStr	Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
title_full_unstemmed	Narrow surface transient and high depth resolution SIMS using 250 eV O2 +
title_sort	narrow surface transient and high depth resolution sims using 250 ev o2 +
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/97299
_version_	1781786643587399680

Narrow surface transient and high depth resolution SIMS using 250 eV O2 +

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