Near-field spectroscopy of silicon dioxide thin films

Near-field spectroscopy of silicon dioxide thin films

10.1103/PhysRevB.85.075419

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Bibliographic Details
Main Authors: Zhang, L.M., Andreev, G.O., Fei, Z., McLeod, A.S., Dominguez, G., Thiemens, M., Castro-Neto, A.H., Basov, D.N., Fogler, M.M.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/97303
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/97303

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