The role of tin oxide surface defects in determining nanonet FET response to humidity and photoexcitation

10.1039/c3tc31713g

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Bibliographic Details
Main Authors: Sun, C., Karthik, K.R.G., Pramana, S.S., Wong, L.H., Zhang, J., Yizhong, H., Sow, C.H., Mathews, N., Mhaisalkar, S.G.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98314
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Institution: National University of Singapore