The role of tin oxide surface defects in determining nanonet FET response to humidity and photoexcitation
10.1039/c3tc31713g
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Main Authors: | Sun, C., Karthik, K.R.G., Pramana, S.S., Wong, L.H., Zhang, J., Yizhong, H., Sow, C.H., Mathews, N., Mhaisalkar, S.G. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/98314 |
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Institution: | National University of Singapore |
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