Drive-current enhancement in FinFETs using gate-induced stress

10.1109/LED.2006.880657

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Bibliographic Details
Main Authors: Tan, K.-M., Liow, T.-Y., Lee, R.T.P., Tung, C.-H., Samudra, G.S., Yoo, W.-J., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55697
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Institution: National University of Singapore