Drive-current enhancement in FinFETs using gate-induced stress

Drive-current enhancement in FinFETs using gate-induced stress

10.1109/LED.2006.880657

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Bibliographic Details
Main Authors: Tan, K.-M., Liow, T.-Y., Lee, R.T.P., Tung, C.-H., Samudra, G.S., Yoo, W.-J., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
FinFET
Metal gate
Mobility
Multiple-gate transistor
Strain
Stress
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55697
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Institution: National University of Singapore
id sg-nus-scholar.10635-55697
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spelling sg-nus-scholar.10635-556972023-10-26T20:09:54Z Drive-current enhancement in FinFETs using gate-induced stress Tan, K.-M. Liow, T.-Y. Lee, R.T.P. Tung, C.-H. Samudra, G.S. Yoo, W.-J. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING FinFET Metal gate Mobility Multiple-gate transistor Strain Stress 10.1109/LED.2006.880657 IEEE Electron Device Letters 27 9 769-771 EDLED 2014-06-17T02:46:05Z 2014-06-17T02:46:05Z 2006-09 Article Tan, K.-M., Liow, T.-Y., Lee, R.T.P., Tung, C.-H., Samudra, G.S., Yoo, W.-J., Yeo, Y.-C. (2006-09). Drive-current enhancement in FinFETs using gate-induced stress. IEEE Electron Device Letters 27 (9) : 769-771. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2006.880657 07413106 http://scholarbank.nus.edu.sg/handle/10635/55697 000240008800020 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic FinFET
Metal gate
Mobility
Multiple-gate transistor
Strain
Stress
spellingShingle FinFET
Metal gate
Mobility
Multiple-gate transistor
Strain
Stress
Tan, K.-M.
Liow, T.-Y.
Lee, R.T.P.
Tung, C.-H.
Samudra, G.S.
Yoo, W.-J.
Yeo, Y.-C.
Drive-current enhancement in FinFETs using gate-induced stress
description 10.1109/LED.2006.880657
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tan, K.-M.
Liow, T.-Y.
Lee, R.T.P.
Tung, C.-H.
Samudra, G.S.
Yoo, W.-J.
Yeo, Y.-C.
format Article
author Tan, K.-M.
Liow, T.-Y.
Lee, R.T.P.
Tung, C.-H.
Samudra, G.S.
Yoo, W.-J.
Yeo, Y.-C.
author_sort Tan, K.-M.
title Drive-current enhancement in FinFETs using gate-induced stress
title_short Drive-current enhancement in FinFETs using gate-induced stress
title_full Drive-current enhancement in FinFETs using gate-induced stress
title_fullStr Drive-current enhancement in FinFETs using gate-induced stress
title_full_unstemmed Drive-current enhancement in FinFETs using gate-induced stress
title_sort drive-current enhancement in finfets using gate-induced stress
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/55697
_version_ 1781412174843871232

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