Segmentation of overlapping particles in automatic size analysis using multi-flash imaging

Segmentation of overlapping particles in automatic size analysis using multi-flash imaging

In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on multi-flash imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions prov...

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Bibliographic Details
Main Authors: KOH, Tze K, MILES, Nicholas, MORGAN, Steve, HAYES-GILL, Barrie
Format: text
Language:English
Published: Institutional Knowledge at Singapore Management University 2007
Subjects:
Image segmentation
Image analysis
Computer vision
Application software
Layout
Image edge detection
Mining industry
Chemical analysis
Lighting
Image processing
Computer Engineering
Online Access:https://ink.library.smu.edu.sg/cis_research/27
https://ink.library.smu.edu.sg/context/cis_research/article/1026/viewcontent/Segmentation_of_overlapping_particles_in_automatic_size_analysis_using_multi_flash_imaging.pdf
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Institution: Singapore Management University
Language: English

Internet

https://ink.library.smu.edu.sg/cis_research/27
https://ink.library.smu.edu.sg/context/cis_research/article/1026/viewcontent/Segmentation_of_overlapping_particles_in_automatic_size_analysis_using_multi_flash_imaging.pdf

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