Segmentation of overlapping particles in automatic size analysis using multi-flash imaging

• Main Authors: KOH, Tze K, MILES, Nicholas, MORGAN, Steve, HAYES-GILL, Barrie
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2007
• Subjects: Image segmentation; Image analysis; Computer vision; Application software; Layout; Image edge detection; Mining industry; Chemical analysis; Lighting; Image processing; Computer Engineering
• Online Access: https://ink.library.smu.edu.sg/cis_research/27; https://ink.library.smu.edu.sg/context/cis_research/article/1026/viewcontent/Segmentation_of_overlapping_particles_in_automatic_size_analysis_using_multi_flash_imaging.pdf
• Institution: Singapore Management University

In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on multi-flash imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions prov...