Themis: Automatic and efficient deep learning system testing with strong fault detection capability

Deep Learning Systems (DLSs) have been widely applied in safety-critical tasks such as autopilot. However, when a perturbed input is fed into a DLS for inference, the DLS often has incorrect outputs (i.e., faults). DLS testing techniques (e.g., DeepXplore) detect such faults by generating perturbed...

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Main Authors: HUANG, Dong, LI, Tsz On, XIE, Xiaofei, CUI, Heming
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Language:English
Published: Institutional Knowledge at Singapore Management University 2024
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Online Access:https://ink.library.smu.edu.sg/sis_research/9509
https://ink.library.smu.edu.sg/context/sis_research/article/10509/viewcontent/Themis_Automatic_and_Efficient_Deep_Learning_Syste.pdf
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spelling sg-smu-ink.sis_research-105092024-11-15T07:44:09Z Themis: Automatic and efficient deep learning system testing with strong fault detection capability HUANG, Dong LI, Tsz On XIE, Xiaofei CUI, Heming Deep Learning Systems (DLSs) have been widely applied in safety-critical tasks such as autopilot. However, when a perturbed input is fed into a DLS for inference, the DLS often has incorrect outputs (i.e., faults). DLS testing techniques (e.g., DeepXplore) detect such faults by generating perturbed inputs to explore data flows that induce faults. Since a DLS often has infinitely many data flows, existing techniques require developers to manually specify a set of activation values in a DLS’s neurons for exploring fault-inducing data flows. Unfortunately, recent studies show that such manual effort is tedious and can detect only a tiny proportion of fault-inducing data flows. In this paper, we present Themis, the first automatic DLS testing system, which attains strong fault detection capability by ensuring a full coverage of fault-inducing data flows at a high probability. Themis carries a new workflow for automatically and systematically revealing data flows whose internal neurons’ outputs vary substantially when the inputs are slightly perturbed, as these data flows are likely fault-inducing. We evaluated Themis on ten different DLSs and found that on average the number of faults detected by Themis was 3.78X more than four notable DLS testing techniques. By retraining all evaluated DLSs with the detected faults, Themis also increased (regained) these DLSs’ accuracies on average 14.7X higher than all baselines. 2024-10-01T07:00:00Z text application/pdf https://ink.library.smu.edu.sg/sis_research/9509 info:doi/10.48550/arXiv.2405.09314 https://ink.library.smu.edu.sg/context/sis_research/article/10509/viewcontent/Themis_Automatic_and_Efficient_Deep_Learning_Syste.pdf http://creativecommons.org/licenses/by-nc-nd/4.0/ Research Collection School Of Computing and Information Systems eng Institutional Knowledge at Singapore Management University Deep Learning Systems (DLSs) Safety-critical tasks Autopilot Fault detection Perturbed input DLS testing techniques Data flows Artificial Intelligence and Robotics Databases and Information Systems
institution Singapore Management University
building SMU Libraries
continent Asia
country Singapore
Singapore
content_provider SMU Libraries
collection InK@SMU
language English
topic Deep Learning Systems (DLSs)
Safety-critical tasks
Autopilot
Fault detection
Perturbed input
DLS testing techniques
Data flows
Artificial Intelligence and Robotics
Databases and Information Systems
spellingShingle Deep Learning Systems (DLSs)
Safety-critical tasks
Autopilot
Fault detection
Perturbed input
DLS testing techniques
Data flows
Artificial Intelligence and Robotics
Databases and Information Systems
HUANG, Dong
LI, Tsz On
XIE, Xiaofei
CUI, Heming
Themis: Automatic and efficient deep learning system testing with strong fault detection capability
description Deep Learning Systems (DLSs) have been widely applied in safety-critical tasks such as autopilot. However, when a perturbed input is fed into a DLS for inference, the DLS often has incorrect outputs (i.e., faults). DLS testing techniques (e.g., DeepXplore) detect such faults by generating perturbed inputs to explore data flows that induce faults. Since a DLS often has infinitely many data flows, existing techniques require developers to manually specify a set of activation values in a DLS’s neurons for exploring fault-inducing data flows. Unfortunately, recent studies show that such manual effort is tedious and can detect only a tiny proportion of fault-inducing data flows. In this paper, we present Themis, the first automatic DLS testing system, which attains strong fault detection capability by ensuring a full coverage of fault-inducing data flows at a high probability. Themis carries a new workflow for automatically and systematically revealing data flows whose internal neurons’ outputs vary substantially when the inputs are slightly perturbed, as these data flows are likely fault-inducing. We evaluated Themis on ten different DLSs and found that on average the number of faults detected by Themis was 3.78X more than four notable DLS testing techniques. By retraining all evaluated DLSs with the detected faults, Themis also increased (regained) these DLSs’ accuracies on average 14.7X higher than all baselines.
format text
author HUANG, Dong
LI, Tsz On
XIE, Xiaofei
CUI, Heming
author_facet HUANG, Dong
LI, Tsz On
XIE, Xiaofei
CUI, Heming
author_sort HUANG, Dong
title Themis: Automatic and efficient deep learning system testing with strong fault detection capability
title_short Themis: Automatic and efficient deep learning system testing with strong fault detection capability
title_full Themis: Automatic and efficient deep learning system testing with strong fault detection capability
title_fullStr Themis: Automatic and efficient deep learning system testing with strong fault detection capability
title_full_unstemmed Themis: Automatic and efficient deep learning system testing with strong fault detection capability
title_sort themis: automatic and efficient deep learning system testing with strong fault detection capability
publisher Institutional Knowledge at Singapore Management University
publishDate 2024
url https://ink.library.smu.edu.sg/sis_research/9509
https://ink.library.smu.edu.sg/context/sis_research/article/10509/viewcontent/Themis_Automatic_and_Efficient_Deep_Learning_Syste.pdf
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