An Empirical Study of Classifier Combination on Cross-Project Defect Prediction

• Main Authors: ZHANG, Yun, David LO, XIA, Xin, SUN, Jianling
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2015
• Subjects: Defect Prediction; Cross-Project; Classifier Combination; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/3099; https://ink.library.smu.edu.sg/context/sis_research/article/4099/viewcontent/compsac15_combination.pdf
• Institution: Singapore Management University

To help developers better allocate testing and debugging efforts, many software defect prediction techniques have been proposed in the literature. These techniques can be used to predict classes that are more likely to be buggy based on past history of buggy classes. These techniques work well as lo...