File-level defect prediction: Unsupervised vs. supervised models

• Main Authors: YAN, Meng, FANG, Yicheng, LO, David, XIA, Xin, ZHANG, Xiaohong
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2017
• Subjects: Software Engineering; Theory and Algorithms
• Online Access: https://ink.library.smu.edu.sg/sis_research/3923; https://ink.library.smu.edu.sg/context/sis_research/article/4925/viewcontent/esem17.pdf
• Institution: Singapore Management University

Background: Software defect models can help software quality assurance teams to allocate testing or code review resources. A variety of techniques have been used to build defect prediction models, including supervised and unsupervised methods. Recently, Yang et al. [1] surprisingly find that unsuper...