Combined classifier for cross-project defect prediction: An extended empirical study

• Main Authors: ZHANG, Yun, LO, David, XIA, Xin, SUN, Jianling
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2018
• Subjects: defect prediction;cross-project;classifier combination; Software Engineering; Systems Architecture
• Online Access: https://ink.library.smu.edu.sg/sis_research/4128; https://ink.library.smu.edu.sg/context/sis_research/article/5131/viewcontent/Combined_classifier_for_cross_project_defect_prediction.pdf
• Institution: Singapore Management University

To facilitate developers in effective allocation of their testing and debugging efforts, many software defect prediction techniques have been proposed in the literature. These techniques can be used to predict classes that are more likely to be buggy based on the past history of classes, methods, or...