Combined classifier for cross-project defect prediction: An extended empirical study
To help developers better allocate testing and debugging efforts, many software defect prediction techniques have been proposed in the literature. These techniques can be used to predict classes that are more likely to be buggy based on past history of buggy classes. These techniques work well as lo...
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Main Authors: | ZHANG, Yun, LO, David, XIA, Xin, SUN, Jianling |
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Format: | text |
Language: | English |
Published: |
Institutional Knowledge at Singapore Management University
2018
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Online Access: | https://ink.library.smu.edu.sg/sis_research/4130 https://ink.library.smu.edu.sg/context/sis_research/article/5133/viewcontent/Combined_classifier_for_cross_project_defect_prediction.pdf |
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Institution: | Singapore Management University |
Language: | English |
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