Just-in-time defect identification and localization: A two-phase framework

• المؤلفون الرئيسيون: YAN, Meng, XIA, Xin, FAN, Yuanrui, HASSAN, Ahmed E., LO, David, LI, Shanping
• التنسيق: text
• اللغة: English
• منشور في: Institutional Knowledge at Singapore Management University 2022
• الموضوعات: Defect Localization; Fans; History; Just-in-Time; Software; Software Naturalness; Task analysis; Computer bugs; Defect Identification; Software Engineering
• الوصول للمادة أونلاين: https://ink.library.smu.edu.sg/sis_research/5899; https://ink.library.smu.edu.sg/context/sis_research/article/6902/viewcontent/JIT_Defect_Ident_tse2020_av.pdf
• المؤسسة: Singapore Management University

Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one chal...