Just-in-time defect identification and localization: A two-phase framework

• Main Authors: YAN, Meng, XIA, Xin, FAN, Yuanrui, HASSAN, Ahmed E., LO, David, LI, Shanping
• 格式: text
• 語言: English
• 出版: Institutional Knowledge at Singapore Management University 2022
• 主題: Defect Localization; Fans; History; Just-in-Time; Software; Software Naturalness; Task analysis; Computer bugs; Defect Identification; Software Engineering
• 在線閱讀: https://ink.library.smu.edu.sg/sis_research/5899; https://ink.library.smu.edu.sg/context/sis_research/article/6902/viewcontent/JIT_Defect_Ident_tse2020_av.pdf
• 機構: Singapore Management University

Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one chal...