Local powers of least-squares-based test for panel fractional Ornstein-Uhlenbeck process

Based on the least squares estimator, this paper proposes a novel method to test the sign of the persistence parameter in a panel fractional Ornstein-Uhlenbeck process with a known Hurst parameter H. Depending on H ∈ (1/2, 1), H = 1/2, or H ∈ (0, 1/2), three test statistics are considered. In the nu...

全面介紹

Saved in:
書目詳細資料
Main Authors: TANAKA, Katsuto, XIAO, Weilin, Jun YU
格式: text
語言:English
出版: Institutional Knowledge at Singapore Management University 2020
主題:
在線閱讀:https://ink.library.smu.edu.sg/soe_research/2358
https://ink.library.smu.edu.sg/context/soe_research/article/3357/viewcontent/LSE_test_14_.pdf
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!

相似書籍