Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems

Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems

There are still many unknowns regarding assembly processes. In this work, we demonstrate the capability of atomic force microscopy (AFM) adhesion mapping in revealing the conditions that promote the light-induced assembly of nanoparticles (NPs) on nanostructured surfaces in inorganic systems, both i...

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Bibliographic Details
Main Authors: Pichitchai Pimpang, Ahmad Sabirin Zoolfakar, Duangmanee Wongratanaphisan, Atcharawon Gardchareon, Emily P. Nguyen, Serge Zhuiykov, Supab Choopun, Kourosh Kalantar-Zadeh
Format: Journal
Published: 2018
Subjects:
Chemistry
Energy
Materials Science
Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84885158180&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/52370
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Institution: Chiang Mai University

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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84885158180&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/52370

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