Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems

Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems

There are still many unknowns regarding assembly processes. In this work, we demonstrate the capability of atomic force microscopy (AFM) adhesion mapping in revealing the conditions that promote the light-induced assembly of nanoparticles (NPs) on nanostructured surfaces in inorganic systems, both i...

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Bibliographic Details
Main Authors: Pimpang P., Zoolfakar A.S., Wongratanaphisan D., Gardchareon A., Nguyen E.P., Zhuiykov S., Choopun S., Kalantar-Zadeh K.
Format: Article
Language:English
Published: 2014
Online Access:http://www.scopus.com/inward/record.url?eid=2-s2.0-84885158180&partnerID=40&md5=3423c2b85a6b4e1267af005f85022c28
http://cmuir.cmu.ac.th/handle/6653943832/7207
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Institution: Chiang Mai University
Language: English

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http://www.scopus.com/inward/record.url?eid=2-s2.0-84885158180&partnerID=40&md5=3423c2b85a6b4e1267af005f85022c28
http://cmuir.cmu.ac.th/handle/6653943832/7207

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