Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems
There are still many unknowns regarding assembly processes. In this work, we demonstrate the capability of atomic force microscopy (AFM) adhesion mapping in revealing the conditions that promote the light-induced assembly of nanoparticles (NPs) on nanostructured surfaces in inorganic systems, both i...
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Main Authors: | Pimpang P., Zoolfakar A.S., Wongratanaphisan D., Gardchareon A., Nguyen E.P., Zhuiykov S., Choopun S., Kalantar-Zadeh K. |
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Format: | Article |
Language: | English |
Published: |
2014
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Online Access: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84885158180&partnerID=40&md5=3423c2b85a6b4e1267af005f85022c28 http://cmuir.cmu.ac.th/handle/6653943832/7207 |
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Institution: | Chiang Mai University |
Language: | English |
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