Atomic force microscopy adhesion mapping: Revealing assembly process in inorganic systems

• Main Authors: Pimpang P., Zoolfakar A.S., Wongratanaphisan D., Gardchareon A., Nguyen E.P., Zhuiykov S., Choopun S., Kalantar-Zadeh K.
• Format: Article
• Language: English
• Published: 2014
• Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-84885158180&partnerID=40&md5=3423c2b85a6b4e1267af005f85022c28; http://cmuir.cmu.ac.th/handle/6653943832/7207
• Institution: Chiang Mai University

There are still many unknowns regarding assembly processes. In this work, we demonstrate the capability of atomic force microscopy (AFM) adhesion mapping in revealing the conditions that promote the light-induced assembly of nanoparticles (NPs) on nanostructured surfaces in inorganic systems, both i...