Dielectric aging of Cr-doped PZT ceramics

The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti0.48)O3were investigated. The composition of Pb(Zr0.52Ti0.48)O3with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching fro...

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Bibliographic Details
Main Authors: P. Ketsuwan, A. Prasatkhetragarn, A. Ngamjarurojana, S. Ananta, R. Yimnirun
Format: Journal
Published: 2018
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Online Access:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84891796229&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/52512
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Institution: Chiang Mai University
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Summary:The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti0.48)O3were investigated. The composition of Pb(Zr0.52Ti0.48)O3with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching from high temperatures above the Curie temperature. The dielectric aging of all compositions revealed relaxor aging behavior. The aging rate of stable stage obeyed a logarithmic time dependence, while the aging rate decreased with increasing Cr2O3at low concentration (0.1-0.6). Further increase in Cr2O3concentration, the aging rate turned to increase. © 2013 Copyright Taylor and Francis Group, LLC.