Dielectric aging of Cr-doped PZT ceramics
The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti0.48)O3were investigated. The composition of Pb(Zr0.52Ti0.48)O3with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching fro...
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th-cmuir.6653943832-525122018-09-04T09:36:08Z Dielectric aging of Cr-doped PZT ceramics P. Ketsuwan A. Prasatkhetragarn A. Ngamjarurojana S. Ananta R. Yimnirun Engineering Materials Science Physics and Astronomy The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti0.48)O3were investigated. The composition of Pb(Zr0.52Ti0.48)O3with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching from high temperatures above the Curie temperature. The dielectric aging of all compositions revealed relaxor aging behavior. The aging rate of stable stage obeyed a logarithmic time dependence, while the aging rate decreased with increasing Cr2O3at low concentration (0.1-0.6). Further increase in Cr2O3concentration, the aging rate turned to increase. © 2013 Copyright Taylor and Francis Group, LLC. 2018-09-04T09:26:29Z 2018-09-04T09:26:29Z 2013-12-01 Journal 16078489 10584587 2-s2.0-84891796229 10.1080/07315171.2013.853561 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84891796229&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/52512 |
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Engineering Materials Science Physics and Astronomy P. Ketsuwan A. Prasatkhetragarn A. Ngamjarurojana S. Ananta R. Yimnirun Dielectric aging of Cr-doped PZT ceramics |
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The aging of dielectric properties of Cr-Doped Pb(Zr0.52Ti0.48)O3were investigated. The composition of Pb(Zr0.52Ti0.48)O3with 0.1, 0.2, 0.4, 0.6, 1.0 and 3.0 mol% of Cr2O3addition were prepared by conventional mixed oxide technique. The aging has been measured at room temperature after quenching from high temperatures above the Curie temperature. The dielectric aging of all compositions revealed relaxor aging behavior. The aging rate of stable stage obeyed a logarithmic time dependence, while the aging rate decreased with increasing Cr2O3at low concentration (0.1-0.6). Further increase in Cr2O3concentration, the aging rate turned to increase. © 2013 Copyright Taylor and Francis Group, LLC. |
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Journal |
author |
P. Ketsuwan A. Prasatkhetragarn A. Ngamjarurojana S. Ananta R. Yimnirun |
author_facet |
P. Ketsuwan A. Prasatkhetragarn A. Ngamjarurojana S. Ananta R. Yimnirun |
author_sort |
P. Ketsuwan |
title |
Dielectric aging of Cr-doped PZT ceramics |
title_short |
Dielectric aging of Cr-doped PZT ceramics |
title_full |
Dielectric aging of Cr-doped PZT ceramics |
title_fullStr |
Dielectric aging of Cr-doped PZT ceramics |
title_full_unstemmed |
Dielectric aging of Cr-doped PZT ceramics |
title_sort |
dielectric aging of cr-doped pzt ceramics |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84891796229&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/52512 |
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