Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics
Ge doped (Bi0.5Na0.5)TiO3ceramics, (Bi0.5Na0.5)Ti1-xGexO3(BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form s...
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| Format: | Journal |
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2018
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| Online Access: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84892886151&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/53644 |
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| Institution: | Chiang Mai University |
| Summary: | Ge doped (Bi0.5Na0.5)TiO3ceramics, (Bi0.5Na0.5)Ti1-xGexO3(BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form single perovskite phase with rhombohedral symmetry. The grain size and morphology of the ceramics were examined by SEM. The average grain size of the ceramics was found to decrease with increasing Ge content. The dielectric constant was measured as a function of both temperature and frequency. All samples exhibited a relaxor ferroelectric behavior. © 2014 Copyright Taylor and Francis Group, LLC. |
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