Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics
Ge doped (Bi0.5Na0.5)TiO3ceramics, (Bi0.5Na0.5)Ti1-xGexO3(BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form s...
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th-cmuir.6653943832-536442018-09-04T10:01:22Z Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics Orawan Khamman Materials Science Physics and Astronomy Ge doped (Bi0.5Na0.5)TiO3ceramics, (Bi0.5Na0.5)Ti1-xGexO3(BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form single perovskite phase with rhombohedral symmetry. The grain size and morphology of the ceramics were examined by SEM. The average grain size of the ceramics was found to decrease with increasing Ge content. The dielectric constant was measured as a function of both temperature and frequency. All samples exhibited a relaxor ferroelectric behavior. © 2014 Copyright Taylor and Francis Group, LLC. 2018-09-04T09:53:56Z 2018-09-04T09:53:56Z 2014-01-02 Journal 15635112 00150193 2-s2.0-84892886151 10.1080/00150193.2013.849981 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84892886151&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/53644 |
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Materials Science Physics and Astronomy Orawan Khamman Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
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Ge doped (Bi0.5Na0.5)TiO3ceramics, (Bi0.5Na0.5)Ti1-xGexO3(BNTG, x = 0, 0.05, 0.10, 0.15 and 0.2), were prepared by using a solid-state method. The crystal structure of the ceramics was investigated by X-ray diffraction method. It was found that, under suitable conditions, all compositions can form single perovskite phase with rhombohedral symmetry. The grain size and morphology of the ceramics were examined by SEM. The average grain size of the ceramics was found to decrease with increasing Ge content. The dielectric constant was measured as a function of both temperature and frequency. All samples exhibited a relaxor ferroelectric behavior. © 2014 Copyright Taylor and Francis Group, LLC. |
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Orawan Khamman |
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Orawan Khamman |
title |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
title_short |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
title_full |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
title_fullStr |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
title_full_unstemmed |
Phase formation and dielectric properties of Ge doped (Bi 0.5Na0.5)TiO3 ceramics |
title_sort |
phase formation and dielectric properties of ge doped (bi 0.5na0.5)tio3 ceramics |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84892886151&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/53644 |
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