Dielectric properties of PZT-PCN ceramics under compressive stress
In this study, ceramics in PZT-PCN systems with a formula (1-x)Pb(Zr 1/2 Ti1/2) O3-(x)Pb(Co1/3Nb 2/3)O3 (x=0.1-0.5) were prepared by a solid-state mixed-oxide technique. The phase formation and microstructure were studied using x-ray diffraction (XRD) and scanning electron microscopy (SEM), respecti...
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th-cmuir.6653943832-55932014-08-30T02:56:42Z Dielectric properties of PZT-PCN ceramics under compressive stress Unruan M. Prasatkhetragarn A. Laosiritaworn Y. Ananta S. Yimnirun R. In this study, ceramics in PZT-PCN systems with a formula (1-x)Pb(Zr 1/2 Ti1/2) O3-(x)Pb(Co1/3Nb 2/3)O3 (x=0.1-0.5) were prepared by a solid-state mixed-oxide technique. The phase formation and microstructure were studied using x-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. Effects of compressive stress on the dielectric properties of PZT-PCN ceramics were investigated at stress up to 230 MPa using a compressometer. The results clearly showed that the dielectric constant of the PZT-PCN ceramics increased significantly with increasing applied stress, while the dielectric loss tangent showed an opposing trend. The experimental observations have been attributed to a combination of the domain switching and the deaging mechanisms from the application of the compressive stress. © 2008 The Royal Swedish Academy of Sciences. 2014-08-30T02:56:42Z 2014-08-30T02:56:42Z 2008 Article 00318949 10.1088/0031-8949/77/04/045702 PHSTB http://www.scopus.com/inward/record.url?eid=2-s2.0-43249131523&partnerID=40&md5=2f0af638195d3d8785f267d044d7f10c http://cmuir.cmu.ac.th/handle/6653943832/5593 English |
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In this study, ceramics in PZT-PCN systems with a formula (1-x)Pb(Zr 1/2 Ti1/2) O3-(x)Pb(Co1/3Nb 2/3)O3 (x=0.1-0.5) were prepared by a solid-state mixed-oxide technique. The phase formation and microstructure were studied using x-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. Effects of compressive stress on the dielectric properties of PZT-PCN ceramics were investigated at stress up to 230 MPa using a compressometer. The results clearly showed that the dielectric constant of the PZT-PCN ceramics increased significantly with increasing applied stress, while the dielectric loss tangent showed an opposing trend. The experimental observations have been attributed to a combination of the domain switching and the deaging mechanisms from the application of the compressive stress. © 2008 The Royal Swedish Academy of Sciences. |
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Article |
author |
Unruan M. Prasatkhetragarn A. Laosiritaworn Y. Ananta S. Yimnirun R. |
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Unruan M. Prasatkhetragarn A. Laosiritaworn Y. Ananta S. Yimnirun R. Dielectric properties of PZT-PCN ceramics under compressive stress |
author_facet |
Unruan M. Prasatkhetragarn A. Laosiritaworn Y. Ananta S. Yimnirun R. |
author_sort |
Unruan M. |
title |
Dielectric properties of PZT-PCN ceramics under compressive stress |
title_short |
Dielectric properties of PZT-PCN ceramics under compressive stress |
title_full |
Dielectric properties of PZT-PCN ceramics under compressive stress |
title_fullStr |
Dielectric properties of PZT-PCN ceramics under compressive stress |
title_full_unstemmed |
Dielectric properties of PZT-PCN ceramics under compressive stress |
title_sort |
dielectric properties of pzt-pcn ceramics under compressive stress |
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2014 |
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http://www.scopus.com/inward/record.url?eid=2-s2.0-43249131523&partnerID=40&md5=2f0af638195d3d8785f267d044d7f10c http://cmuir.cmu.ac.th/handle/6653943832/5593 |
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