Measurement of secondary electron emission yields

• المؤلفون الرئيسيون: Chutopa Y., Yotsombat B., Brown I.G.
• التنسيق: مقال
• اللغة: English
• منشور في: 2014
• الوصول للمادة أونلاين: http://www.scopus.com/inward/record.url?eid=2-s2.0-0242386607&partnerID=40&md5=64688e3dbe8b19eb9dd6554f791ad156; http://cmuir.cmu.ac.th/handle/6653943832/5874

The authors describe a method for the measurement of secondary electron emission coefficients and demonstrate the use of this approach for the measurement of secondary electron yields for titanium, copper, and carbon ions incident upon an aluminum target. The method is time-resolved in that a series...