Measurement of secondary electron emission yields

Measurement of secondary electron emission yields

The authors describe a method for the measurement of secondary electron emission coefficients and demonstrate the use of this approach for the measurement of secondary electron yields for titanium, copper, and carbon ions incident upon an aluminum target. The method is time-resolved in that a series...

Saved in:

書目詳細資料
Main Authors:	Chutopa Y., Yotsombat B., Brown I.G.
格式:	Article
語言:	English
出版:	2014
在線閱讀:	http://www.scopus.com/inward/record.url?eid=2-s2.0-0242386607&partnerID=40&md5=64688e3dbe8b19eb9dd6554f791ad156 http://cmuir.cmu.ac.th/handle/6653943832/5874
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

相似書籍

Optical emission spectra of a copper plasma produced by a metal vapour vacuum arc plasma source
由: Yotsombat B., et al.
出版: (2014)

The effect of secondary electrons on emission
由: Li, Yuan, et al.
出版: (2013)

Secondary and backscattered electron yields of polymer surface under electron beam irradiation
由: Song, Z.G., et al.
出版: (2014)

Determination of secondary electron yield from insulators due to a low-kV electron beam
由: Yong, Y.C., et al.
出版: (2014)

Tuning the electron affinity and secondary electron emission of diamond (100) surfaces by diels-alder reaction
由: Qi, D., et al.
出版: (2014)

Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
由: Sim, K.S., et al.
出版: (2014)

Yield curve estimation in the Philippine secondary bond market
由: Mendoza, Aldrean M.
出版: (2018)

Secondary electron emission properties of III-nitride/ZnO coaxial heterostructures under ion and X-ray bombardment
由: Cholewa, M., et al.
出版: (2014)

PARAMETRIC YIELD ENHANCEMENT OF ELECTRONIC CIRCUITS
由: WU TING
出版: (2020)

SECONDARY IONS EMISSION FROM SI(100)
由: LOW HENG SIONG
出版: (2020)

Yield stress measurement by a penetration method
由: Thiam-Soon Tan, et al.
出版: (2014)

Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope
由: Khursheed, Anjam
出版: (2021)

CARBON EMISSIONS MONITORING AND PREDICTION SYSTEM IN SECONDARY EDUCATION INSTITUTIONS
由: D'Arc Amara Hanieka, Jeanne

Determination of secondary electron spectra from insulators
由: Yong, Y.C., et al.
出版: (2014)

Synthesis of high electron yield nanomaterials for radiation detector applications
由: Lau, Daniel Shu Ping.
出版: (2008)

Unilateral Measures and Emissions Mitigation
由: CHATTERJI, Shurojit, et al.
出版: (2010)

Unilateral measures and emissions mitigation
由: CHATTERJI, Shurojit, et al.
出版: (2012)

Secondary electron detection for distributed axis electron beam systems
由: Tanimoto, S., et al.
出版: (2014)

An add-on secondary electron energy spectrometer for scanning electron microscopes
由: Khursheed, A., et al.
出版: (2014)

Eccentric loading of fluorogen with aggregation-induced emission in PLGA matrix increases nanoparticle fluorescence quantum yield for targeted cellular imaging
由: Geng, J., et al.
出版: (2014)

HASIL AMAN (SAFE YIELD) EKSPLOITASI AIR TANAH UNTUK KEBUTUHAN RUMAH TANGGA DAN INDUSTRI DI KOTAMADIA SEMARANG
由: , Ig. Setyawan Purnama
出版: (2000)

Subthreshold characteristics of ballistic electron emission spectra
由: Qin, H. L., et al.
出版: (2013)

Local electron field emission study of two-dimensional carbon
由: Wang, Y., et al.
出版: (2014)

Formation of secondary organic aerosol coating on black carbon particles near vehicular emissions
由: Lee, A.K.Y, et al.
出版: (2020)

Demonstration of secondary electron detection using monolithic multi-channel electron detector
由: Tanimoto, S., et al.
出版: (2014)

Demonstration of secondary electron detection using monolithic multi-channel electron detector
由: Tanimoto, S., et al.
出版: (2014)

Electron emission and switching phenomena in diamond-like carbon based electronic devices
由: Lau, Daniel Shu Ping, et al.
出版: (2008)

STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
由: WONG PEI YU CALVIN
出版: (2018)

SO2 Emission Measurement by Doas (Differential optical absorption...
由: Perpustakaan UGM, i-lib
出版: (2008)

Measurement of yield stress for concentrated suspensions using a plate device
由: Zhang, M.-H., et al.
出版: (2014)

Quantitative material analysis using secondary electron energy spectromicroscopy
由: Han, W., et al.
出版: (2021)

Modeling of electron emission : its physics and novel applications
由: Wu, Lin
出版: (2009)

Oxide coated silicon tip arrays for electron emission
由: Bian, Haijiao
出版: (2011)

MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
由: AVINASH SRINIVASAN
出版: (2015)

SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
由: HAN WEIDING
出版: (2020)

Eccentric loading of fluorogen with aggregation-induced emission in PLGA matrix increases nanoparticle fluorescence quantum yield for targeted cellular imaging
由: Geng, Junlong, et al.
出版: (2014)

Monolithic multichannel secondary electron detector for distributed axis electron beam lithography and inspection
由: Pickard, D.S., et al.
出版: (2014)

Electron field emission from reduced graphene oxide on polymer film
由: Sameera, I., et al.
出版: (2014)

Nanoscale imaging with a portable field emission scanning electron microscope
由: Khursheed, A., et al.
出版: (2014)

Effect of gas pressure on electron field emission from carbon nanotube forests
由: Tsakadze, Z.L., et al.
出版: (2014)