Measurement of secondary electron emission yields

The authors describe a method for the measurement of secondary electron emission coefficients and demonstrate the use of this approach for the measurement of secondary electron yields for titanium, copper, and carbon ions incident upon an aluminum target. The method is time-resolved in that a series...

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Main Authors: Chutopa Y., Yotsombat B., Brown I.G.
格式: Article
語言:English
出版: 2014
在線閱讀:http://www.scopus.com/inward/record.url?eid=2-s2.0-0242386607&partnerID=40&md5=64688e3dbe8b19eb9dd6554f791ad156
http://cmuir.cmu.ac.th/handle/6653943832/5874
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機構: Chiang Mai University
語言: English