Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage
Metal-containing tetrahedral amorphous carbon films were produced by dual filtered cathodic vacuum arc plasma sources operated in sequentially pulsed mode. Negatively pulsed bias was applied to the substrate when carbon plasma was generated, whereas it was absent when the molybdenum plasma was prese...
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th-cmuir.6653943832-613892018-09-10T04:10:36Z Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage Nitisak Pasaja Sakon Sansongsiri Saweat Intarasiri Thiraphat Vilaithong André Anders Physics and Astronomy Metal-containing tetrahedral amorphous carbon films were produced by dual filtered cathodic vacuum arc plasma sources operated in sequentially pulsed mode. Negatively pulsed bias was applied to the substrate when carbon plasma was generated, whereas it was absent when the molybdenum plasma was presented. Film thickness was measured after deposition by profilometry. Glass slides with silver pads were used as substrates for the measurement of the sheet resistance. The microstructure and composition of the films were characterized by Raman spectroscopy and Rutherford backscattering, respectively. It was found that the electrical resistivity decreases with an increase of the Mo content, which can be ascribed to an increase of the sp2content and an increase of the sp2cluster size. © 2007 Elsevier B.V. All rights reserved. 2018-09-10T04:10:36Z 2018-09-10T04:10:36Z 2007-06-01 Journal 0168583X 2-s2.0-34248680771 10.1016/j.nimb.2007.02.093 https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34248680771&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61389 |
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Physics and Astronomy Nitisak Pasaja Sakon Sansongsiri Saweat Intarasiri Thiraphat Vilaithong André Anders Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
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Metal-containing tetrahedral amorphous carbon films were produced by dual filtered cathodic vacuum arc plasma sources operated in sequentially pulsed mode. Negatively pulsed bias was applied to the substrate when carbon plasma was generated, whereas it was absent when the molybdenum plasma was presented. Film thickness was measured after deposition by profilometry. Glass slides with silver pads were used as substrates for the measurement of the sheet resistance. The microstructure and composition of the films were characterized by Raman spectroscopy and Rutherford backscattering, respectively. It was found that the electrical resistivity decreases with an increase of the Mo content, which can be ascribed to an increase of the sp2content and an increase of the sp2cluster size. © 2007 Elsevier B.V. All rights reserved. |
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Journal |
author |
Nitisak Pasaja Sakon Sansongsiri Saweat Intarasiri Thiraphat Vilaithong André Anders |
author_facet |
Nitisak Pasaja Sakon Sansongsiri Saweat Intarasiri Thiraphat Vilaithong André Anders |
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Nitisak Pasaja |
title |
Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
title_short |
Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
title_full |
Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
title_fullStr |
Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
title_full_unstemmed |
Mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
title_sort |
mo-containing tetrahedral amorphous carbon deposited by dual filtered cathodic vacuum arc with selective pulsed bias voltage |
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2018 |
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34248680771&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61389 |
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