System development of a time-of-flight spectrometer for surface analysis of materials
This is original study on design the time-of-flight Rutherford backscattering spectrometry (TOF-RBS) technique for nano-material surface analysis with high resolution. At Fast Neutron Research Facility, FNRF, upgrading of the existing pulsed-beam accelerator from 150-keV of D+ to 280 keV of He+ was...
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| Main Authors: | , , , , , |
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| Format: | Conference Proceeding |
| Published: |
2018
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| Subjects: | |
| Online Access: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898835073&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61945 |
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| Institution: | Chiang Mai University |