System development of a time-of-flight spectrometer for surface analysis of materials

• المؤلفون الرئيسيون: P. Junphong, V. Ano, S. Rattanarin, D. Suwannakachorn, T. Vilaithong, A. Takahashi
• التنسيق: وقائع المؤتمر
• منشور في: 2018
• الموضوعات: Physics and Astronomy
• الوصول للمادة أونلاين: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898835073&origin=inward; http://cmuir.cmu.ac.th/jspui/handle/6653943832/61945

This is original study on design the time-of-flight Rutherford backscattering spectrometry (TOF-RBS) technique for nano-material surface analysis with high resolution. At Fast Neutron Research Facility, FNRF, upgrading of the existing pulsed-beam accelerator from 150-keV of D+ to 280 keV of He+ was...